共 40 条
[1]
ADIROVICH EI, 1956, DOKL AKAD NAUK SSSR+, V108, P417
[2]
AMITH, COMMUNICATION
[3]
PHOTOCONDUCTIVE AND PHOTOELECTROMAGNETIC LIFETIME DETERMINATION IN PRESENCE OF TRAPPING .1. SMALL SIGNALS
[J].
PHYSICAL REVIEW,
1959, 116 (04)
:793-802
[4]
AMITH A, 1959, B AM PHYS SOC, V4, P28
[6]
THE STATISTICS OF DIVALENT IMPURITY CENTRES IN A SEMICONDUCTOR
[J].
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B,
1956, 69 (12)
:1335-1339
[7]
CLARKE DH, 1957, J ELECTRON CONTR, V3, P375
[8]
FAN HY, 1954, PHYS REV, V93, P1434, DOI 10.1103/PhysRev.93.1434.7
[9]
EFFECT OF TRAPS ON CARRIER INJECTION IN SEMICONDUCTORS
[J].
PHYSICAL REVIEW,
1953, 92 (06)
:1424-1428