DO WE NEED A NEW METHODOLOGY FOR GAAS PASSIVATION

被引:56
作者
GREEN, AM
SPICER, WE
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1993年 / 11卷 / 04期
关键词
D O I
10.1116/1.578442
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Previous results on the GaAs:native oxide interface are reviewed and their implications to present attempts at GaAs passivation are discussed. Large band gap semiconductors and the use of sulfur and Sb termination as a means to passivate the surface are discussed. Although sulfur treatments do not lead to ideal (flatband) electrical termination, this treatment exhibits greatly reduced surface recombination. Sb gives an ideal termination which results in the surface Fermi level close to the flatband condition. Both of these treatments have failed as practical passivating processes because they have insufficient chemical stability against the atmosphere. A new methodology for passivating compound semiconductors is presented in which two overlayers are used. In this approach, the first overlayer defines the surface electrically and the second provides long term protection.
引用
收藏
页码:1061 / 1069
页数:9
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