ATOMIC-FORCE MICROSCOPY ON THE SI(111)7X7 SURFACE

被引:61
作者
HOWALD, L
LUTHI, R
MEYER, E
GUNTHERODT, HJ
机构
[1] Institut fur Physik, Universität Basel, CH-4056 Basel
来源
PHYSICAL REVIEW B | 1995年 / 51卷 / 08期
关键词
D O I
10.1103/PhysRevB.51.5484
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Force-microscopy measurements are performed on the Si(111) surface. The 7×7 reconstruction is observed in the repulsive contact mode. With applied contact pressures of 110 GPa the reconstructed surface remains stable. Variations of frictional forces of the order of 10-9 N are observed on the atomic scale. © 1995 The American Physical Society.
引用
收藏
页码:5484 / 5487
页数:4
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