共 8 条
[2]
ORIGIN OF FRINGE STRUCTURE OBSERVED IN HIGH-RESOLUTION BRIGHT-FIELD ELECTRON-MICROGRAPHS OF AMORPHOUS MATERIALS
[J].
PHILOSOPHICAL MAGAZINE,
1976, 33 (06)
:985-1014
[5]
POSSIBILITY OF DIRECT IMAGING OF POINT-DEFECTS IN CRYSTALS USING TRANSMISSION ELECTRON-MICROSCOPY
[J].
PHILOSOPHICAL MAGAZINE,
1977, 35 (03)
:575-592