LASER ANNEALING OF COPPER AND SILICON THIN-FILMS

被引:3
作者
BLOCH, J
ZEIRI, Y
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期
关键词
D O I
10.1116/1.574509
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
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页码:1831 / 1835
页数:5
相关论文
共 9 条
[1]   LASER-INDUCED MORPHOLOGY CHANGES IN THIN COPPER-FILMS [J].
BLOCH, J ;
ZEIRI, Y .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (07) :2637-2644
[2]   LASER MIRROR DAMAGE IN GERMANIUM AT 10.6 MU [J].
EMMONY, DC ;
HOWSON, RP ;
WILLIS, LJ .
APPLIED PHYSICS LETTERS, 1973, 23 (11) :598-600
[3]   SURFACE RIPPLES ON SILICON AND GALLIUM-ARSENIDE UNDER PICOSECOND LASER ILLUMINATION [J].
FAUCHET, PM ;
SIEGMAN, AE .
APPLIED PHYSICS LETTERS, 1982, 40 (09) :824-826
[4]   PERIODIC SURFACE RIPPLES IN LASER-TREATED ALUMINUM AND THEIR USE TO DETERMINE ABSORBED POWER [J].
JAIN, AK ;
KULKARNI, VN ;
SOOD, DK ;
UPPAL, JS .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (07) :4882-4884
[5]   DIFFRACTION FROM LASER-INDUCED DEFORMATION ON REFLECTIVE SURFACES [J].
KOO, JC ;
SLUSHER, RE .
APPLIED PHYSICS LETTERS, 1976, 28 (10) :614-616
[6]   PERIODIC REGROWTH PHENOMENA PRODUCED BY LASER ANNEALING OF ION-IMPLANTED SILICON [J].
LEAMY, HJ ;
ROZGONYI, GA ;
SHENG, TT ;
CELLER, GK .
APPLIED PHYSICS LETTERS, 1978, 32 (09) :535-537
[7]  
NEMANICH RJ, 1983, MATER RES SOC S P, V13, P211
[8]   NEW EXPERIMENTAL-EVIDENCE OF THE PERIODIC SURFACE-STRUCTURE IN LASER ANNEALING [J].
ORON, M ;
SORENSEN, G .
APPLIED PHYSICS LETTERS, 1979, 35 (10) :782-784
[9]   METAL REFLECTIVITY UNDER HIGH-INTENSITY OPTICAL RADIATION [J].
ZAVECZ, TE ;
SAIFI, MA ;
NOTIS, M .
APPLIED PHYSICS LETTERS, 1975, 26 (04) :165-168