ELECTRON-MICROSCOPY OF SURFACE-STRUCTURE

被引:52
作者
COWLEY, JM
机构
关键词
D O I
10.1016/0079-6816(86)90006-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:209 / 250
页数:42
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共 104 条
[81]  
SUITO E, 1953, P JAPAN ACAD, V29, P324
[82]   HIGH-RESOLUTION SURFACE STUDY BY INSITU UHV TRANSMISSION ELECTRON-MICROSCOPY [J].
TAKAYANAGI, K .
ULTRAMICROSCOPY, 1982, 8 (1-2) :145-161
[83]   STRUCTURE-ANALYSIS OF SI(111)-7X7 RECONSTRUCTED SURFACE BY TRANSMISSION ELECTRON-DIFFRACTION [J].
TAKAYANAGI, K ;
TANISHIRO, Y ;
TAKAHASHI, S ;
TAKAHASHI, M .
SURFACE SCIENCE, 1985, 164 (2-3) :367-392
[84]   SURFACE-STRUCTURE IMAGING BY ELECTRON-MICROSCOPY [J].
TAKAYANAGI, K .
JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV) :287-298
[86]   SURFACE-POTENTIAL STUDY OF AU(111) SURFACES [J].
TAN, CS ;
MCCOWLEY, J .
ULTRAMICROSCOPY, 1984, 12 (04) :333-344
[87]   ON THE PHASE-TRANSITION BETWEEN THE (7X7) AND (1X1) STRUCTURES OF SILICON(111) SURFACE STUDIED BY REFLECTION ELECTRON-MICROSCOPY [J].
TANISHIRO, Y ;
TAKAYANAGI, K ;
YAGI, K .
ULTRAMICROSCOPY, 1983, 11 (2-3) :95-102
[88]  
TANISHIRO Y, 1981, ACTA CRYSTALLOGR A, V37, pC300
[89]   INTERACTIONS OF ELECTRON-BEAMS WITH SURFACES OF MGO CRYSTALS [J].
TANJI, T ;
COWLEY, JM .
ULTRAMICROSCOPY, 1985, 17 (04) :287-302
[90]   STEM AND CTEM OBSERVATIONS OF INTERFERENCE BETWEEN LAUE-DIFFRACTED AND BRAGG-DIFFRACTED ELECTRONS IN IMAGES OF POLYHEDRAL CRYSTALS [J].
TURNER, PS ;
COWLEY, JM .
ULTRAMICROSCOPY, 1981, 6 (02) :125-138