INFLUENCE OF PREFERRED ORIENTATION ON LINE WIDTH AND PEAK SHIFT OF (HK) INTERFERENCES

被引：15

作者：

RULAND, W

TOMPA, H

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1972年 / 5卷 / JUN1期

关键词：

D O I：

10.1107/S0021889872009240

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：225 / &

共 10 条

[1] DIFFRACTIONS DES RAYONS X PAR LES STRUCTURES EN COUCHES DESORDONNEES .1. [J].

BRINDLEY, GW ;

MERING, J .

ACTA CRYSTALLOGRAPHICA, 1951, 4 (05) :441-447

[2] EFFECT OF PREFERRED ORIENTATION ON (HK) INTERFERENCES AS SHOWN BY ELECTRON DIFFRACTION OF CARBON FIBRES [J].

FOURDEUX, A ;

PERRET, R ;

RULAND, W .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 :252-&

[3]

Laue MV, 1932, Z KRISTALLOGR, V82, P127

[4] MICROSTRUCTURE OF PAN-BASE CARBON FIBRES [J].

PERRET, R ;

RULAND, W .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 (DEC1) :525-&

[5] PROFILE ANALYSIS OF RANDOM-LAYER LINES [J].

PERRET, R ;

RULAND, W .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 :257-&

[6] FOURIER TRANSFORM METHODS FOR RANDOM-LAYER LINE PROFILES [J].

RULAND, W .

ACTA CRYSTALLOGRAPHICA, 1967, 22 :615-&

[7] EFFECT OF PREFERRED ORIENTATION ON INTENSITY DISTRIBUTION OF (HK) INTERFERENCES [J].

RULAND, W ;

TOMPA, H .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :93-&

[8] X-ray diffraction in random layer lattices [J].

Warren, BE .

PHYSICAL REVIEW, 1941, 59 (09) :693-698

[9] SHAPE OF 2-DIMENSIONAL CARBON BLACK REFLECTIONS [J].

WARREN, BE ;

BODENSTEIN, P .

ACTA CRYSTALLOGRAPHICA, 1966, 20 :602-+

[10] X-RAY DIFFRACTION BY RANDOM LAYERS - IDEAL LINE PROFILES AND DETERMINATION OF STRUCTURE AMPLITUDES FROM OBSERVED LINE PROFILES [J].

WILSON, AJC .

ACTA CRYSTALLOGRAPHICA, 1949, 2 (04) :245-251

← 1 →