RASTER SCANNING DEPTH PROFILING OF LAYER STRUCTURES

[1] BENNINGH.A, 1971, Z ANGEW PHYSIK, V31, P31

[2] BENNINGH.A, 1969, Z ANGEW PHYSIK, V27, P51

[3] ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION [J]. ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05): : 403 - +

[4] BUHL R, 1975, VAKUUM-TECH, V24, P189

[5] CROSET PM, 1971, REV TECH THANSON CSF, V3, P19

[6] ANALYSIS OF THIN FILMS BY ION MICROPROBE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1970, 42 (09) : 1060 - &

[7] ELECTRONIC APERTURE FOR IN-DEPTH ANALYSIS OF SOLIDS WITH AN ION MICROPROBE [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1976, 19 (03): : 327 - 334

[8] DEPTH-PROFILING OF CU-NI SANDWICH SAMPLES BY SECONDARY ION MASS-SPECTROMETRY [J]. APPLIED PHYSICS, 1975, 8 (04): : 359 - 360

[9] Hofker W. K., 1973, Applied Physics, V2, P265, DOI 10.1007/BF00889509

[10] HOFKER WK, 1973, RADIAT EFF, V17, P83

[1] BENNINGH.A, 1971, Z ANGEW PHYSIK, V31, P31

[2] BENNINGH.A, 1969, Z ANGEW PHYSIK, V27, P51

[3] ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION [J]. ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05): : 403 - +

[4] BUHL R, 1975, VAKUUM-TECH, V24, P189

[5] CROSET PM, 1971, REV TECH THANSON CSF, V3, P19

[6] ANALYSIS OF THIN FILMS BY ION MICROPROBE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1970, 42 (09) : 1060 - &

[7] ELECTRONIC APERTURE FOR IN-DEPTH ANALYSIS OF SOLIDS WITH AN ION MICROPROBE [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1976, 19 (03): : 327 - 334

[8] DEPTH-PROFILING OF CU-NI SANDWICH SAMPLES BY SECONDARY ION MASS-SPECTROMETRY [J]. APPLIED PHYSICS, 1975, 8 (04): : 359 - 360

[9] Hofker W. K., 1973, Applied Physics, V2, P265, DOI 10.1007/BF00889509

[10] HOFKER WK, 1973, RADIAT EFF, V17, P83