THICKNESS DEPENDENCE OF THE ELECTRICAL-RESISTIVITY OF EPITAXIALLY GROWN SILVER FILMS

被引:32
作者
DAYAL, D
RUDOLF, P
WISSMANN, P
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D O I
10.1016/0040-6090(81)90278-9
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T [工业技术];
学科分类号
08 ;
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页码:193 / 199
页数:7
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