INTERFACE STUDIES OF MIS STRUCTURE BY SURFACE PHOTOVOLTAGE MEASUREMENTS

被引：12

作者：

LAM, YW

机构：

来源：

ELECTRONICS LETTERS | 1970年 / 6卷 / 06期

关键词：

D O I：

10.1049/el:19700108

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：153 / +

页数：1

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