SCANNING TUNNELING MICROSCOPIC INVESTIGATIONS OF ELECTROFORMED PLANAR METAL-INSULATOR-METAL DIODES

被引：14

作者：

PAGNIA, H

SOTNIK, N

WIRTH, W

机构：

[1] Institut für Angewandte Physik, Technische Hochschule, Darmstadt, D6100

来源：

INTERNATIONAL JOURNAL OF ELECTRONICS | 1990年 / 69卷 / 01期

关键词：

D O I：

10.1080/00207219008920287

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Electroformed metal-insulator-metal diodes showing voltage controlled negative resistance are investigated with a scanning tunnelling microscope. The topography and the potential distribution are recorded simultaneously at various voltages applied across the sample. The sharp potential drop in the microslit suggests a layer model with current carrying filaments between the layers. Material transport in the vicinity of the potential drop may be an indication of the existence of hot spots. © 1990 Taylor & Francis Ltd.

引用

页码：25 / 32

页数：8

共 17 条

[1] SOME REMARKS TO THE ELECTRO-LUMINESCENCE OF DISCONTINUOUS GOLD-FILMS [J].