THE USE OF A CALIBRATION IN LOW-ENERGY ION-SCATTERING - PREFERENTIAL SPUTTERING AND S SEGREGATION IN CUPD ALLOYS

被引:20
作者
ACKERMANS, PAJ
KRUTZEN, GCR
BRONGERSMA, HH
机构
[1] Department of Physics, Eindhoven University of Technology, 5600 MB Eindhoven
关键词
D O I
10.1016/0168-583X(90)90857-Q
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The composition of the outermost atomic layer of an alloy can be determined quantitatively by low-energy ion scattering. The calibration procedure yields information about the presence and location of surface contaminants. The results strongly suggest that S, a contaminant in CuPd alloys, segregates preferentially on top of the Cu atoms. The preferential sputtering of CuPd has been studied. Cu turns out to be sputtered preferentially. © 1990.
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收藏
页码:384 / 389
页数:6
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