THE USE OF A CALIBRATION IN LOW-ENERGY ION-SCATTERING - PREFERENTIAL SPUTTERING AND S SEGREGATION IN CUPD ALLOYS

被引：20

作者：

ACKERMANS, PAJ

KRUTZEN, GCR

BRONGERSMA, HH

机构：

[1] Department of Physics, Eindhoven University of Technology, 5600 MB Eindhoven

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 45卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90857-Q

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The composition of the outermost atomic layer of an alloy can be determined quantitatively by low-energy ion scattering. The calibration procedure yields information about the presence and location of surface contaminants. The results strongly suggest that S, a contaminant in CuPd alloys, segregates preferentially on top of the Cu atoms. The preferential sputtering of CuPd has been studied. Cu turns out to be sputtered preferentially. © 1990.

引用

页码：384 / 389

页数：6

共 13 条

[1]

ACKERMANS PAJ, IN PRESS SURF SCI

[2]

Brongersma H H, 1978, Rev Sci Instrum, V49, P707, DOI 10.1063/1.1135598

[3] ION SCATTERING - SPECTROSCOPIC TOOL FOR STUDY OF OUTERMOST ATOMIC LAYER OF A SOLID SURFACE [J].