THE SURFACE-COMPOSITION OF PD-CU ALLOYS - A COMPARATIVE INVESTIGATION OF PHOTOELECTRIC WORK FUNCTION MEASUREMENTS, AUGER-ELECTRON SPECTROSCOPY AND CALCULATIONS BASED ON A BROKEN BOND APPROXIMATION

被引：62

作者：

VANLANGEVELD, AD ^{[1
]}

HENDRICKX, HACM ^{[1
]}

NIEUWENHUYS, BE ^{[1
]}

机构：

[1] LEIDEN STATE UNIV,GORLAEUS LABS,2300 RA LEIDEN,NETHERLANDS

来源：

THIN SOLID FILMS | 1983年 / 109卷 / 02期

关键词：

D O I：

10.1016/0040-6090(83)90137-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：179 / 192

页数：14

共 57 条

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[9] THICKNESS PERIODICITY IN THE AUGER LINE-SHAPES FROM EPITAXIAL (111)PD-(111)CU FILMS
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 695 - 699
[10] PREPARATION AND SURFACE CHARACTERIZATION OF EPITAXIALLY GROWN PALLADIUM ALLOYS
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