ION-BEAM SYSTEMS FOR SURFACE ANALYSIS

被引：8

作者：

HURLEY, RE

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1972年 / 5卷 / 11期

关键词：

D O I：

10.1088/0022-3735/5/11/030

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1025 / +

页数：1

共 179 条

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