SAMPLING PROCEDURE FOR MEASURING HALL-COEFFICIENTS USING THE VANDERPAUW METHOD

被引：8

作者：

NDLELA, Z ^{[1
]}

BATES, CW ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT MAT SCI & ENGN & ELECT ENGN,STANFORD,CA 94305

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 11期

关键词：

D O I：

10.1063/1.1140497

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：3482 / 3484

页数：3

共 13 条

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[7] MEASUREMENT OF HIGH-RESISTIVITY SEMICONDUCTORS USING VANDERPAUW METHOD [J].

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[8] IMPROVED METHOD FOR MEASURING HALL COEFFICIENTS [J].

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