MEASUREMENT OF HIGH-RESISTIVITY SEMICONDUCTORS USING VANDERPAUW METHOD

被引：79

作者：

HEMENGER, PM ^{[1
]}

机构：

[1] USAF,MAT LABS,WRIGHT PATTERSON AFB,OH 45433

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1973年 / 44卷 / 06期

关键词：

D O I：

10.1063/1.1686224

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：698 / 700

页数：3

共 13 条

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