PSEUDO-ATOMIC-ORBITAL BAND THEORY APPLIED TO ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURES

被引：49

作者：

WENG, XD ^{[1
]}

REZ, P ^{[1
]}

SANKEY, OF ^{[1
]}

机构：

[1] ARIZONA STATE UNIV, CTR SOLID STATE SCI, TEMPE, AZ 85287 USA

来源：

PHYSICAL REVIEW B | 1989年 / 40卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.40.5694

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5694 / 5704

页数：11

共 65 条

[1] L2,3 EDGE OF SILICON - THEORY AND EXPERIMENT [J].

AEBI, P ;

KELLER, J ;

ERBUDAK, M ;

VANINI, F .

PHYSICAL REVIEW B, 1988, 38 (08) :5392-5396

[2]

Ahn C.C., 1983, EELS ATLAS

[3] CORE EXCITONS AND SOFT-X-RAY THRESHOLD OF SILICON [J].

ALTARELL.M ;

DEXTER, DL .

PHYSICAL REVIEW LETTERS, 1972, 29 (16) :1100-&

[4]

Ashcroft N. W, 1976, SOLID STATE PHYS

[5] THEORY OF EXTENDED X-RAY ABSORPTION-EDGE FINE-STRUCTURE (EXAFS) IN CRYSTALLINE SOLIDS [J].

ASHLEY, CA ;

DONIACH, S .

PHYSICAL REVIEW B, 1975, 11 (04) :1279-1288

[6] LOCAL BONDING AND ELECTRONIC-STRUCTURE OBTAINED FROM ELECTRON-ENERGY LOSS SCATTERING [J].

BATSON, PE ;

KAVANAGH, KL ;

WONG, CY ;

WOODALL, JM .

ULTRAMICROSCOPY, 1987, 22 (1-4) :89-101

[7] SOFT-X-RAY ELECTROREFLECTANCE - FINAL-STATE EFFECTS ON SI(2P) OPTICAL-TRANSITIONS [J].

BAUER, RS ;

BACHRACH, RZ ;

MCMENAMIN, JC ;

ASPNES, DE .

NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA B-GENERAL PHYSICS RELATIVITY ASTRONOMY AND MATHEMATICAL PHYSICS AND METHODS, 1977, 39 (02) :409-416

[8]

Bethe H, 1930, ANN PHYS-BERLIN, V5, P325

[9] MULTIPLE-SCATTERING EFFECTS IN THE K-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE OF CRYSTALLINE AND AMORPHOUS-SILICON [J].

BIANCONI, A ;

DICICCO, A ;

PAVEL, NV ;

BENFATTO, M ;

MARCELLI, A ;

NATOLI, CR ;

PIANETTA, P ;

WOICIK, J .

PHYSICAL REVIEW B, 1987, 36 (12) :6426-6433

[10]

BIANCONI A, 1982, EXAFS NEAR EDGE STRU, P57

← 1 2 3 4 5 6 7 →