SOFT-X-RAY ELECTROREFLECTANCE - FINAL-STATE EFFECTS ON SI(2P) OPTICAL-TRANSITIONS

被引:30
作者
BAUER, RS
BACHRACH, RZ
MCMENAMIN, JC
ASPNES, DE
机构
[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
[2] BELL TEL LABS INC,MURRAY HILL,NJ 07974
来源
NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA B-GENERAL PHYSICS RELATIVITY ASTRONOMY AND MATHEMATICAL PHYSICS AND METHODS | 1977年 / 39卷 / 02期
关键词
D O I
10.1007/BF02725767
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:409 / 416
页数:8
相关论文
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