CMOS RELIABILITY - A USEFUL CASE-HISTORY TO REVISE EXTRAPOLATION EFFECTIVENESS, LENGTH AND SLOPE OF THE LEARNING-CURVE

被引：8

作者：

BRAMBILLA, P

FANTINI, F

MALBERTI, P

MATTANA, G

机构：

来源：

MICROELECTRONICS RELIABILITY | 1981年 / 21卷 / 02期

关键词：

D O I：

10.1016/0026-2714(81)90389-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：191 / 201

页数：11

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