NON-LINEAR SCREENING OF POSITIVE POINT CHARGES IN DIAMOND, SILICON, AND GERMANIUM

被引:18
作者
CSAVINSZKY, P
BROWNSTEIN, KR
机构
来源
PHYSICAL REVIEW B | 1981年 / 24卷 / 08期
关键词
D O I
10.1103/PhysRevB.24.4566
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:4566 / 4570
页数:5
相关论文
共 4 条
[1]   NON-LINEAR IMPURITY SCREENING IN SEMICONDUCTORS [J].
CORNOLTI, F ;
RESTA, R .
PHYSICAL REVIEW B, 1978, 17 (08) :3239-3242
[2]  
COURANT R, 1966, METHODS MATH PHYSICS, V1, P260
[3]   THOMAS-FERMI DIELECTRIC SCREENING IN SEMICONDUCTORS [J].
CSAVINSZKY, P .
PHYSICAL REVIEW B, 1980, 21 (02) :632-633
[4]   THOMAS-FERMI DIELECTRIC SCREENING IN SEMICONDUCTORS [J].
RESTA, R .
PHYSICAL REVIEW B, 1977, 16 (06) :2717-2722