STRUCTURAL PERFECTION OF INGAAS/INP STRAINED-LAYER SUPERLATTICES GROWN BY GAS SOURCE MOLECULAR-BEAM EPITAXY - A HIGH-RESOLUTION X-RAY-DIFFRACTION STUDY

被引：30

作者：

VANDENBERG, JM

GERSHONI, D

HAMM, RA

PANISH, MB

TEMKIN, H

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 66卷 / 08期

关键词：

D O I：

10.1063/1.344072

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3635 / 3638

页数：4

共 14 条

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