AN INTEGRATION METHOD FOR THE ANALYSIS OF MULTIEXPONENTIAL TRANSIENT SIGNALS

被引:26
作者
TITTELBACHHELMRICH, K
机构
[1] Inst. fur Halbleiterphys., Frankfurt-Oder
关键词
D O I
10.1088/0957-0233/4/12/003
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new algorithm is introduced to analyse multiexponential transient signals optionally including a non-zero baseline. It requires a digitized transient and allows one to determine time constants and amplitudes of discrete components which are supposed to compose the signal. The algorithm is based on a fit of the signal against its (for more than one component multiple) integral(s). It is tested using simulated transients with white or discretization noise. The results are found to be quite accurate even for noisy signals, and they are compared with those obtained from other fitting methods.
引用
收藏
页码:1323 / 1329
页数:7
相关论文
共 17 条
[1]   RETRIEVAL OF FREQUENCIES, AMPLITUDES, DAMPING FACTORS, AND PHASES FROM TIME-DOMAIN SIGNALS USING A LINEAR LEAST-SQUARES PROCEDURE [J].
BARKHUIJSEN, H ;
DEBEER, R ;
BOVEE, WMMJ ;
VANORMONDT, D .
JOURNAL OF MAGNETIC RESONANCE, 1985, 61 (03) :465-481
[2]  
Dohler H., 1987, Experimentelle Technik der Physik, V35, P401
[3]  
FENYO S, 1983, THEORIE PRAXIS LINEA, V3, P130
[4]   METHOD FOR THE ANALYSIS OF MULTICOMPONENT EXPONENTIAL DECAY CURVES [J].
GARDNER, DG ;
GARDNER, JC ;
LAUSH, G ;
MEINKE, WW .
JOURNAL OF CHEMICAL PHYSICS, 1959, 31 (04) :978-986
[5]   RESOLUTION OF MAJOR DEEP LEVELS IN AU-DOPED AND PT-DOPED SI [J].
HARTSON, SE ;
HALDER, NC .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1991, 125 (02) :741-748
[6]   REFINEMENTS IN THE METHOD OF MOMENTS FOR ANALYSIS OF MULTIEXPONENTIAL CAPACITANCE TRANSIENTS IN DEEP-LEVEL TRANSIENT SPECTROSCOPY [J].
IKOSSIANASTASIOU, K ;
ROENKER, KP .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (01) :182-190
[7]   THE ANALYSIS OF EXPONENTIAL AND NON-EXPONENTIAL TRANSIENTS IN DEEP-LEVEL TRANSIENT SPECTROSCOPY [J].
KIRCHNER, PD ;
SCHAFF, WJ ;
MARACAS, GN ;
EASTMAN, LF ;
CHAPPELL, TI ;
RANSOM, CM .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (11) :6462-6470
[8]   ESTIMATING THE PARAMETERS OF EXPONENTIALLY DAMPED SINUSOIDS AND POLE-ZERO MODELING IN NOISE [J].
KUMARESAN, R ;
TUFTS, DW .
IEEE TRANSACTIONS ON ACOUSTICS SPEECH AND SIGNAL PROCESSING, 1982, 30 (06) :833-840
[9]   CORRELATION METHOD FOR SEMICONDUCTOR TRANSIENT SIGNAL MEASUREMENTS [J].
MILLER, GL ;
RAMIREZ, JV ;
ROBINSON, DAH .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (06) :2638-2644
[10]   ERROR-AFFECTED EXPERIMENTAL-DATA ANALYSIS - APPLICATION TO FITTING PROCEDURES [J].
NERI, F ;
PATANE, S ;
SAITTA, G .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1990, 1 (10) :1007-1010