STRUCTURAL INVESTIGATION OF HYDROGENATED AMORPHOUS-SILICON BY X-RAY-DIFFRACTION

被引：38

作者：

SCHULKE, W

机构：

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1981年 / 43卷 / 03期

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D O I：

10.1080/01418638108222109

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：451 / 468

页数：18

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