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FIELD-ION MICROSCOPE STUDIES OF THE PROPAGATION OF SUBSTRATE GRAIN-BOUNDARIES INTO AN OVERGROWTH

被引：3
作者：
INAL, OT
MURR, LE
机构：
来源：
THIN SOLID FILMS | 1980年 / 72卷 / 01期
关键词：
D O I：
10.1016/0040-6090(80)90570-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：161 / 170
页数：10
相关论文
共 7 条
[1]  
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[2]   GROWTH-CHARACTERISTICS OF COPPER ON TUNGSTEN GROWN THROUGH CEMENTATION, VAPOR-DEPOSITION AND ELECTROPLATING [J].
INAL, OT ;
TORMA, AE .
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[3]   CHARACTERIZATION OF COPPER NUCLEATION AND GROWTH FROM AQUEOUS-SOLUTION ON ALUMINUM - TRANSMISSION ELECTRON-MICROSCOPY STUDY OF COPPER CEMENTATION [J].
MURR, LE ;
ANNAMALAI, V .
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[4]   ROLE OF SUBSTRATE DISLOCATIONS AND GRAIN-BOUNDARIES IN THE NUCLEATION AND GROWTH OF THIN ELECTROCHEMICAL OVERGROWTHS - TEM AND FIM STUDIES [J].
MURR, LE ;
INAL, OT .
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[5]   ORIGIN OF IMAGE STREAKS IN FIELD ION MICROSCOPY [J].
MURR, LE ;
INAL, OT .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 4 (01) :159-&
[6]   FIELD-ION MICROSCOPE STUDY OF VAPOR-DEPOSITED PLATINUM [J].
MURR, LE ;
SINGH, HP ;
INAL, OT .
THIN SOLID FILMS, 1972, 9 (02) :241-+
[7]   CRYSTAL DEFECTS IN COATINGS AND THEIR INFLUENCE ON COATING PROPERTIES [J].
MURR, LE ;
INAL, OT .
THIN SOLID FILMS, 1979, 64 (01) :77-90
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