SCANNING PROBE MICROSCOPE IMAGING OF POLYANILINE THIN-FILMS IN NONCONTACT MODE

被引：7

作者：

PORTER, TL ^{[1
]}

SYKES, AG ^{[1
]}

CAPLE, G ^{[1
]}

机构：

[1] NO ARIZONA UNIV,DEPT CHEM,FLAGSTAFF,AZ 86001

来源：

SURFACE AND INTERFACE ANALYSIS | 1994年 / 21卷 / 11期

关键词：

D O I：

10.1002/sia.740211113

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The structure of electropolymerized thin films of polyaniline has been studied using the techniques of contact and non-contact scanning probe microscopy (SPM). Films exposed to Ir+ cations in solution, as well as unexposed films, were examined. Contact-mode SPM images of these films reveal only a diffuse, amorphous surface structure in both types of film, while non-contact SPM images indicate an intricate, nanometer-scale domain structure. Film growth is in a layer-by-layer mode, with each layer consisting of small polymer bundles of average dimension 1000 +/- 75 Angstrom. The Ir+ incorporation in these films does not involve a restructuring of the film morphology. The relevance of the microscopic domain structure to models describing conduction mechanisms in these films is also discussed.

引用

页码：814 / 817

页数：4

共 23 条

[1] POLYANILINE - SOLUTIONS, FILMS AND OXIDATION-STATE [J].