DIRECTION AND DEPTH OF ATOM PROBE ANALYSIS

被引：44

作者：

BLAVETTE, D

SARRAU, JM

BOSTEL, A

GALLOT, J

机构：

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1982年 / 17卷 / 07期

关键词：

D O I：

10.1051/rphysap:01982001707043500

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：435 / 440

页数：6

相关论文

共 18 条

[1] COMPOSITION OF MC PRECIPITATES IN A TITANIUM STABILIZED AUSTENITIC STAINLESS-STEEL
ANDREN, HO
HENJERED, A
NORDEN, H
[J]. JOURNAL OF MATERIALS SCIENCE, 1980, 15 (09) : 2365 - 2368
[2] ATOM PROBE ANALYSIS OF BAINITIC PHASE BOUNDARIES IN A LOW ALLOYED CR MO STEEL
BACH, PW
BEYER, J
VERBRAAK, CA
[J]. SCRIPTA METALLURGICA, 1980, 14 (02): : 205 - 210
[3] ATOMIC PROBE ANALYSIS OF PRECIPITATES IN A FECR20NI2AL2 ALLOY
BLAVETTE, D
MARTIN, C
GALLOT, J
[J]. SCRIPTA METALLURGICA, 1982, 16 (01): : 59 - 64
[4] THE ELECTRIC-FIELD DISTRIBUTION IN THE FIELD-ION MICROSCOPE AS A FUNCTION OF SPECIMEN SHANK
GIPSON, GS
EATON, HC
[J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (10) : 5537 - 5539
[5] VELOCITY DISTRIBUTION OF ELECTRONS IN FIELD EMISSION - RESOLUTION IN THE PROJECTION MICROSCOPE
GOMER, R
[J]. JOURNAL OF CHEMICAL PHYSICS, 1952, 20 (11) : 1772 - 1776
[6] GORINGE MJ, 1971, JKA-JERNKONTORET ANN, V155, P502
[7] AN ATOM PROBE STUDY OF THE ANOMALOUS FIELD EVAPORATION OF ALLOYS CONTAINING SILICON
MILLER, MK
SMITH, GDW
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (01): : 57 - 62
[8] A GONIOMETER HEAD FOR AN ATOM-PROBE FIELD-ION MICROSCOPE
SARRAU, JM
GALLOT, J
AVENEL, O
ROUBEAU, P
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (07): : 800 - 802
[9] ION TRAJECTORIES IN FIELD-ION MICROSCOPE
SMITH, R
WALLS, JM
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1978, 11 (04) : 409 - 419
[10] PROJECTION GEOMETRY OF FIELD-ION IMAGE
SOUTHWORTH, HN
WALLS, JM
[J]. SURFACE SCIENCE, 1978, 75 (01) : 129 - 140