CORRELATION OF NOISE CHARACTERISTICS AND LINE-SHAPE WITH LINEWIDTH REBROADENING OF MQW DFB LASERS

被引:5
作者
KANO, F
FUKUDA, M
YOSHIDA, J
机构
[1] NTT Opto-electronics Laboratories, Kanagawa
关键词
D O I
10.1109/68.124859
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The line shape and noise characteristics of narrow linewidth MQW DFB lasers were measured in the range near the linewidth rebroadening. Excellent correlation between the linewidth rebroadening and line shape change was observed. The linewidth rebroadening is also related to the intensity and frequency noise characteristics.
引用
收藏
页码:13 / 15
页数:3
相关论文
共 9 条
[1]   THEORY OF THE LINEWIDTH OF SEMICONDUCTOR-LASERS [J].
HENRY, CH .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (02) :259-264
[3]   250 KHZ SPECTRAL LINEWIDTH OPERATION OF 1.5 MU-M MULTIPLE QUANTUM-WELL DFB-LDS [J].
KITAMURA, M ;
YAMAZAKI, H ;
SASAKI, T ;
KIDA, N ;
HASUMI, H ;
MITO, I .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1990, 2 (05) :310-311
[4]   THE SEMICONDUCTOR-LASER LINEWIDTH DUE TO THE PRESENCE OF SIDE MODES [J].
KRUGER, U ;
PETERMANN, K .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1988, 24 (12) :2355-2358
[5]   EFFECT OF 1/F NOISE ON THE SPECTRAL LINEWIDTH OF CORRUGATION-PITCH-MODULATED MULTIQUANTUM-WELL DISTRIBUTED FEEDBACK LASERS AT HIGH OUTPUT POWER [J].
OKAI, M ;
TSUCHIYA, T ;
UOMI, K ;
CHINONE, N ;
HARADA, T .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1991, 3 (05) :427-429
[6]   CORRUGATION-PITCH-MODULATED MQW-DFB LASER WITH NARROW SPECTRAL LINEWIDTH (170-KHZ) [J].
OKAI, M ;
TSUCHIYA, T ;
UOMI, K ;
CHINONE, N ;
HARADA, T .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1990, 2 (08) :529-530
[7]   INFLUENCE OF NONLINEAR GAIN ON DFB LASER LINEWIDTH [J].
PAN, X ;
OLESEN, H ;
TROMBORG, B .
ELECTRONICS LETTERS, 1990, 26 (14) :1074-1076
[8]   CORRELATION OF RELATIVE INTENSITY NOISE WITH LINEWIDTH FLOORS IN NARROW LINEWIDTH DFB LASERS [J].
SUNDARESAN, H ;
FLETCHER, NC .
ELECTRONICS LETTERS, 1990, 26 (24) :2002-2003
[9]   CURRENT TAILORING FOR LOWERING LINEWIDTH FLOOR [J].
YASAKA, H ;
FUKUDA, M ;
IKEGAMI, T .
ELECTRONICS LETTERS, 1988, 24 (12) :760-762