ELIMINATION OF TUNING-INDUCED BURNOUT AND BIAS-CIRCUIT OSCILLATIONS IN IMPATT OSCILLATORS

被引：48

作者：

BRACKETT, CA ^{[1
]}

机构：

[1] BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA

来源：

BELL SYSTEM TECHNICAL JOURNAL | 1973年 / 52卷 / 03期

关键词：

D O I：

10.1002/j.1538-7305.1973.tb01964.x

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：271 / 306

页数：36

共 14 条

[1]

BLUE JL, 1969, AT&T TECH J, V48, P383

[2] INDUCED DC NEGATIVE RESISTANCE IN AVALANCHE DIODES [J].

CLORFEINE, AS ;

HUGHES, RD .

PROCEEDINGS OF THE IEEE, 1969, 57 (05) :841-+

[3] TUNING-INITIATED FAILURE IN AVALANCHE DIODES [J].

EVANS, WJ ;

SCHARFETTER, DL ;

JOHNSTON, RL ;

KEY, PL .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (02) :799-+

[4]

GEWARTOWSKI JW, 1970, IEEE T MICROW THEORY, VMT18, P157

[5] NOISE IN AVALANCHE TRANSIT-TIME DEVICES [J].

GUPTA, MS .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1971, 59 (12) :1674-&

[6]

Kurokawa K., 1968, IEEE T MICROW THEORY, V16, P234

[7]

KUROKAWA K, 1969, AT&T TECH J, V48, P1937

[8] A SINGLE-TUNED OSCILLATOR FOR IMPATT CHARACTERIZATIONS [J].

MAGALHAE.FM ;

KUROKAWA, K .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (05) :831-&

[9]

OLSON HM, 1971, Patent No. 3621463

[10]

READ WT, 1958, AT&T TECH J, V37, P401

← 1 2 →