THE SEARCH FOR NEUTRON-INDUCED HARD ERRORS IN VLSI STRUCTURES

被引：11

作者：

SROUR, JR

OTHMER, S

BAHRAMAN, A

HARTMANN, RA

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1981年 / 28卷 / 06期

关键词：

D O I：

10.1109/TNS.1981.4335657

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：3968 / 3974

页数：7

共 26 条

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