PROPERTIES OF ANODIC OXIDE-FILMS ON N-TYPE GAAS, GAAS0.6P0.4 AND GAP

被引:11
作者
SIXT, G [1 ]
ZIEGLER, KH [1 ]
FAHRNER, WR [1 ]
机构
[1] FRAUNHOFER INST,INST ANGEW FESTKORPERPHYS,D-7800 FREIBURG,FED REP GER
关键词
D O I
10.1016/0040-6090(79)90056-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Oxide layers were grown anodically on n-type GaAs, GaAs0.6P0.4 and GaP using a 3% aqueous solution of tartaric acid in propylene glycol as electrolyte. The oxide films were examined by secondary ion mass spectrometry and ellipsometry before and after annealing in nitrogen at 400°C. The results show that anodic oxide films on III-V compound semiconductors are composed of several oxide layers. Capacitance-voltage measurements on metal-oxide-semiconductor diodes prepared with anodic oxides revealed electrical instabilities such as a frequency dispersion and a field-induced hyeteresis. These anomalies can be explained by imperfections of the oxide-semiconductor interface. © 1979.
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页码:107 / 116
页数:10
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