A 100 NS 5 V-ONLY 64KX1 MOS DYNAMIC RAM

被引:11
作者
CHAN, JY
BARNES, JJ
WANG, CY
DEBLASI, JM
GUIDRY, MR
机构
[1] VLSI DESIGN ASSOC,SARATOGA,CA
[2] FAIRCHILD SEMICOND,MOUNTAIN VIEW,CA 94040
关键词
D O I
10.1109/JSSC.1980.1051480
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:839 / 846
页数:8
相关论文
共 10 条
  • [1] LOW-TEMPERATURE DIFFERENTIAL OXIDATION FOR DOUBLE POLYSILICON VLSI DEVICES
    BARNES, JJ
    DEBLASI, JM
    DEAL, BE
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (10) : 1779 - 1785
  • [2] A HIGH-PERFORMANCE SENSE AMPLIFIER FOR A 5-V DYNAMIC RAM
    BARNES, JJ
    CHAN, JY
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1980, 15 (05) : 831 - 839
  • [3] FAULT-TOLERANT 64K DYNAMIC RANDOM-ACCESS MEMORY
    CENKER, RP
    CLEMONS, DG
    HUBER, WR
    PETRIZZI, JB
    PROCYK, FJ
    TROUT, GM
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (06) : 853 - 860
  • [4] DESIMONE RR, 1979, ISSCC DIG TECH PAPER, P154
  • [5] IEDA N, 1977, 9TH C SOL STAT DEV D, P17
  • [6] 64 KBIT MOS DYNAMIC RANDOM-ACCESS MEMORY
    NATORI, K
    OGURA, M
    IWAI, H
    MAEGUCHI, K
    TAGUCHI, S
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (04) : 560 - 563
  • [7] RAO GRM, 1978, ELECTRONICS 0928, P109
  • [8] RIDEOUT VL, 1979, IEEE T ELECTRON DEVI, V26, P845
  • [9] 64KX1 BIT DYNAMIC ED-MOS RAM
    WADA, T
    KUDOH, O
    SAKAMOTO, M
    YAMANAKA, H
    NAKAMURA, K
    KAMOSHIDA, M
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1978, 13 (05) : 600 - 606
  • [10] 150-NS, 150-MW, 64K DYNAMIC MOS RAM
    WADA, T
    TAKADA, M
    MATSUE, S
    KAMOSHIDA, M
    SUZUKI, SI
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1978, 13 (05) : 607 - 611