INTERFACE PROPERTIES OF AL2O3-GE STRUCTURE AND CHARACTERISTICS OF AL2O3-GE MOS TRANSISTORS

被引:29
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IWAUCHI, S
TANAKA, T
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10.1143/JJAP.10.260
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O59 [应用物理学];
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页码:260 / +
页数:1
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共 17 条
[2]  
GRAY PV, 1966, APPL PHYS LETTERS, V8
[3]  
HATTORI T, TO BE PUBLISHED
[5]  
MORIN FJ, 1954, PHYS REV, V94
[6]   SI-SIO2 INTERFACE - ELECTRICAL PROPERTIES AS DETERMINED BY METAL-INSULATOR-SILICON CONDUCTANCE TECHNIQUE [J].
NICOLLIA.EH ;
GOETZBER.A .
BELL SYSTEM TECHNICAL JOURNAL, 1967, 46 (06) :1055-+
[7]   MOS STUDY OF INTERFACE-STATE TIME CONSTANT DISPERSION [J].
NICOLLIAN, EH ;
GOETZBERGER, A .
APPLIED PHYSICS LETTERS, 1967, 10 (02) :60-+
[8]  
NISHIMATSU S, 1968, ELECTROCHEM SOC M MO
[9]   CONTRIBUTIONS OF SURFACE STATES TO MOS IMPEDANCE [J].
PREIER, H .
APPLIED PHYSICS LETTERS, 1967, 10 (12) :361-&
[10]  
REISMAN A, 1969, ELECTRONICS