MEASUREMENTS OF CARBON THIN-FILMS USING X-RAY REFLECTIVITY

被引：65

作者：

TONEY, MF ^{[1
]}

BRENNAN, S ^{[1
]}

机构：

[1] STANFORD SYNCHROTRON RADIAT LAB,STANFORD,CA 94309

来源：

关键词：

D O I：

10.1063/1.344361

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1861 / 1863

页数：3

共 17 条

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