AN XPS INVESTIGATION OF ALUMINA THIN-FILMS UTILIZED IN INELASTIC ELECTRON-TUNNELING SPECTROSCOPY

被引：42

作者：

EVANS, HE

BOWSER, WM

WEINBERG, WH

机构：

来源：

APPLICATIONS OF SURFACE SCIENCE | 1980年 / 5卷 / 03期

关键词：

D O I：

10.1016/0378-5963(80)90065-3

中图分类号：

学科分类号：

摘要：

引用

页码：258 / 274

页数：17

共 56 条

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