AN XPS INVESTIGATION OF ALUMINA THIN-FILMS UTILIZED IN INELASTIC ELECTRON-TUNNELING SPECTROSCOPY

被引:42
作者
EVANS, HE
BOWSER, WM
WEINBERG, WH
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来源
APPLICATIONS OF SURFACE SCIENCE | 1980年 / 5卷 / 03期
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D O I
10.1016/0378-5963(80)90065-3
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页码:258 / 274
页数:17
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