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EFFICIENT NUMERICAL SOLUTION OF TRANSMISSION-LINE EQUIVALENT-CIRCUIT MODEL OF A SEMICONDUCTOR
被引:6
作者
:
GREEN, MA
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, DEPT ELECT ENGN, HAMILTON, ONTARIO, CANADA
GREEN, MA
SHEWCHUN, J
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, DEPT ELECT ENGN, HAMILTON, ONTARIO, CANADA
SHEWCHUN, J
机构
:
[1]
MCMASTER UNIV, DEPT ELECT ENGN, HAMILTON, ONTARIO, CANADA
[2]
MCMASTER UNIV, DEPT ENGN PHYS, HAMILTON, ONTARIO, CANADA
来源
:
ELECTRONICS LETTERS
|
1973年
/ 9卷
/ 20期
关键词
:
D O I
:
10.1049/el:19730347
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:474 / 475
页数:2
相关论文
共 8 条
[1]
MINORITY-CARRIER EFFECTS UPON SMALL-SIGNAL AND STEADY-STATE PROPERTIES OF SCHOTTKY DIODES
[J].
GREEN, MA
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, DEPT ELECT ENGN, HAMILTON, ONTARIO, CANADA
GREEN, MA
;
SHEWCHUN, J
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, DEPT ELECT ENGN, HAMILTON, ONTARIO, CANADA
SHEWCHUN, J
.
SOLID-STATE ELECTRONICS,
1973,
16
(10)
:1141
-1150
[2]
SIMPLIFIED COMPUTATIONAL TREATMENT OF RECOMBINATION CENTERS IN TRANSMISSION-LINE EQUIVALENT CIRCUIT MODEL OF A SEMICONDUCTOR
[J].
GREEN, MA
论文数:
0
引用数:
0
h-index:
0
GREEN, MA
;
TEMPLE, VAK
论文数:
0
引用数:
0
h-index:
0
TEMPLE, VAK
;
SHEWCHUN, J
论文数:
0
引用数:
0
h-index:
0
SHEWCHUN, J
.
SOLID-STATE ELECTRONICS,
1972,
15
(09)
:1027
-+
[3]
HENNIG F, TO BE PUBLISHED
[4]
SAH CT, 1967, PR INST ELECTR ELECT, V55, P654
[5]
EQUIVALENT CIRCUIT MODEL IN SOLID-STATE ELECTRONICS .3. CONDUCTION AND DISPLACEMENT CURRENTS
[J].
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
.
SOLID-STATE ELECTRONICS,
1970,
13
(12)
:1547
-+
[6]
SMALL-SIGNAL EQUIVALENT PI NETWORKS FOR CARRIER GENERATION-RECOMBINATION-TRAPPING AT IMPERFECTION CENTRES IN SEMICONDUCTORS
[J].
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
.
ELECTRONICS LETTERS,
1971,
7
(24)
:713
-+
[7]
APPLICATION OF TRANSMISSION-LINE EQUIVALENT CIRCUIT MODEL TO ANALYSIS OF PN JUNCTION ADMITTANCE UNDER DC BIAS
[J].
SMILEY, CF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, DEPT ELECT ENGN, URBANA, IL 61801 USA
SMILEY, CF
;
YAU, LD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, DEPT ELECT ENGN, URBANA, IL 61801 USA
YAU, LD
;
SAH, CT
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, DEPT ELECT ENGN, URBANA, IL 61801 USA
SAH, CT
.
SOLID-STATE ELECTRONICS,
1973,
16
(08)
:895
-901
[8]
EXACT FREQUENCY-DEPENDENT COMPLEX ADMITTANCE OF MOS DIODE INCLUDING SURFACE STATES, SHOCKLEY-READ-HALL (SRH) IMPURITY EFFECTS, AND LOW-TEMPERATURE DOPANT IMPURITY RESPONSE
[J].
TEMPLE, V
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, ENGN PHYS DEPT, HAMILTON, ONTARIO, CANADA
TEMPLE, V
;
SHEWCHUN, J
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, ENGN PHYS DEPT, HAMILTON, ONTARIO, CANADA
SHEWCHUN, J
.
SOLID-STATE ELECTRONICS,
1973,
16
(01)
:93
-113
←
1
→
共 8 条
[1]
MINORITY-CARRIER EFFECTS UPON SMALL-SIGNAL AND STEADY-STATE PROPERTIES OF SCHOTTKY DIODES
[J].
GREEN, MA
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, DEPT ELECT ENGN, HAMILTON, ONTARIO, CANADA
GREEN, MA
;
SHEWCHUN, J
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, DEPT ELECT ENGN, HAMILTON, ONTARIO, CANADA
SHEWCHUN, J
.
SOLID-STATE ELECTRONICS,
1973,
16
(10)
:1141
-1150
[2]
SIMPLIFIED COMPUTATIONAL TREATMENT OF RECOMBINATION CENTERS IN TRANSMISSION-LINE EQUIVALENT CIRCUIT MODEL OF A SEMICONDUCTOR
[J].
GREEN, MA
论文数:
0
引用数:
0
h-index:
0
GREEN, MA
;
TEMPLE, VAK
论文数:
0
引用数:
0
h-index:
0
TEMPLE, VAK
;
SHEWCHUN, J
论文数:
0
引用数:
0
h-index:
0
SHEWCHUN, J
.
SOLID-STATE ELECTRONICS,
1972,
15
(09)
:1027
-+
[3]
HENNIG F, TO BE PUBLISHED
[4]
SAH CT, 1967, PR INST ELECTR ELECT, V55, P654
[5]
EQUIVALENT CIRCUIT MODEL IN SOLID-STATE ELECTRONICS .3. CONDUCTION AND DISPLACEMENT CURRENTS
[J].
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
.
SOLID-STATE ELECTRONICS,
1970,
13
(12)
:1547
-+
[6]
SMALL-SIGNAL EQUIVALENT PI NETWORKS FOR CARRIER GENERATION-RECOMBINATION-TRAPPING AT IMPERFECTION CENTRES IN SEMICONDUCTORS
[J].
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
.
ELECTRONICS LETTERS,
1971,
7
(24)
:713
-+
[7]
APPLICATION OF TRANSMISSION-LINE EQUIVALENT CIRCUIT MODEL TO ANALYSIS OF PN JUNCTION ADMITTANCE UNDER DC BIAS
[J].
SMILEY, CF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, DEPT ELECT ENGN, URBANA, IL 61801 USA
SMILEY, CF
;
YAU, LD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, DEPT ELECT ENGN, URBANA, IL 61801 USA
YAU, LD
;
SAH, CT
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, DEPT ELECT ENGN, URBANA, IL 61801 USA
SAH, CT
.
SOLID-STATE ELECTRONICS,
1973,
16
(08)
:895
-901
[8]
EXACT FREQUENCY-DEPENDENT COMPLEX ADMITTANCE OF MOS DIODE INCLUDING SURFACE STATES, SHOCKLEY-READ-HALL (SRH) IMPURITY EFFECTS, AND LOW-TEMPERATURE DOPANT IMPURITY RESPONSE
[J].
TEMPLE, V
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, ENGN PHYS DEPT, HAMILTON, ONTARIO, CANADA
TEMPLE, V
;
SHEWCHUN, J
论文数:
0
引用数:
0
h-index:
0
机构:
MCMASTER UNIV, ENGN PHYS DEPT, HAMILTON, ONTARIO, CANADA
SHEWCHUN, J
.
SOLID-STATE ELECTRONICS,
1973,
16
(01)
:93
-113
←
1
→