EFFECT OF ZINC IMPURITY ON SILICON SOLAR-CELL EFFICIENCY

被引:47
作者
SAH, CT
CHAN, PCH
WANG, CK
SAH, RLY
YAMAKAWA, KA
LUTWACK, R
机构
[1] MIT,CAMBRIDGE,MA 02139
[2] CALTECH,JET PROP LAB,PASADENA,CA 91103
关键词
D O I
10.1109/T-ED.1981.20333
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:304 / 313
页数:10
相关论文
共 28 条
[1]   ELECTRON-MOBILITY EMPIRICALLY RELATED TO PHOSPHORUS CONCENTRATION IN SILICON [J].
BACCARANI, G ;
OSTOJA, P .
SOLID-STATE ELECTRONICS, 1975, 18 (06) :579-580
[2]  
BLOCHER JM, 1979, DOEJPL9643397915
[3]   DOUBLE-ACCEPTOR BEHAVIOR OF ZINC IN SILICON [J].
CARLSON, RO .
PHYSICAL REVIEW, 1957, 108 (06) :1390-1393
[4]   CARRIER MOBILITIES IN SILICON EMPIRICALLY RELATED TO DOPING AND FIELD [J].
CAUGHEY, DM ;
THOMAS, RE .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (12) :2192-+
[5]   EXACT EQUIVALENT-CIRCUIT MODEL FOR STEADY-STATE CHARACTERIZATION OF SEMICONDUCTOR-DEVICES WITH MULTIPLE-ENERGY-LEVEL RECOMBINATION CENTERS [J].
CHAN, PCH ;
SAH, CT .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (06) :924-936
[6]   COMPUTER-AIDED STUDY OF STEADY-STATE CARRIER LIFETIMES UNDER ARBITRARY INJECTION CONDITIONS [J].
CHAN, PCH ;
SAH, CT .
SOLID-STATE ELECTRONICS, 1979, 22 (11) :921-926
[7]   BORON-DIFFUSION IN SILICON-CONCENTRATION AND ORIENTATION DEPENDENCE, BACKGROUND EFFECTS, AND PROFILE ESTIMATION [J].
FAIR, RB .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (06) :800-805
[8]   ANALYSIS OF PHOSPHORUS-DIFFUSED LAYERS IN SILICON [J].
FAIR, RB .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (02) :323-327
[9]   DIFFUSION AND ELECTRICAL BEHAVIOR OF ZINC IN SILICON [J].
FULLER, CS ;
MORIN, FJ .
PHYSICAL REVIEW, 1957, 105 (02) :379-383
[10]  
GRAY PE, 1962, PHYSICAL ELECTRONICS