SURFACE-DIFFUSION IN THE SOLID-ON-SOLID MODEL

We present results in 1+1 and 2+1 dimensions for surface diffusion controlled profile relaxation for the solid-on-solid model above and below the roughening transition. For all cases examined we found that the characteristic time scale for the decay of a sinusoidal profile scaled with the wavelength L as Lz where 4. These results can be understood in terms of the anomalous diffusion displayed by tracer atoms whose root mean square displacement scaled as t1/4. © 1995 The American Physical Society.