THE ON-ORBIT MEASUREMENTS OF SINGLE EVENT PHENOMENA BY ETS-V SPACECRAFT

被引：16

作者：

GOKA, T ^{[1
]}

KUBOYAMA, S ^{[1
]}

SHIMANO, Y ^{[1
]}

KAWANISHI, T ^{[1
]}

机构：

[1] NATL SPACE DEV AGCY JAPAN,TSUKUBA,JAPAN

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1991年 / 38卷 / 06期

关键词：

D O I：

10.1109/23.124164

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The on-orbit data of single event phenomena were obtained for the CMOS static RAMs equipped in Engineering Test Satellite-V (ETS-V) in a geostationary orbit. The single event latchup and single event upset data were acquired for a period of about 3 years, and the effects of solar flares were observed. A comparison with the data (single event upset) of TTL SRAMs by Marine Observation Satellite-1 (MOS-1: a medium-altitude satellite) was also conducted. The Poisson distribution and the extreme-value theory (double exponential distribution) were adopted to analyze the data. From this analysis a decrease of the number of single events could be found during the solar maximum.

引用

页码：1693 / 1699

页数：7

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