THE EFFECT OF ELEVATED-TEMPERATURE ON LATCHUP AND BIT ERRORS IN CMOS DEVICES

被引：31

作者：

KOLASINSKI, WA ^{[1
]}

KOGA, R ^{[1
]}

SCHNAUSS, E ^{[1
]}

DUFFEY, J ^{[1
]}

机构：

[1] HUGHES AIRCRAFT CO,ELECTRO OPT DATA SYST GRP,MANHATTAN BEACH,CA 90266

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1986年 / 33卷 / 06期

关键词：

D O I：

10.1109/TNS.1986.4334649

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1605 / 1609

页数：5

共 8 条

[1] HIGH-TEMPERATURE SCHOTTKY TTL LATCHUP [J].

COOPER, MS ;

RETZLER, JP ;

MESSENGER, GC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (06) :1538-1544

[2] ERROR ANALYSIS AND PREVENTION OF COSMIC ION-INDUCED SOFT ERRORS IN STATIC CMOS RAMS [J].

DIEHL, SE ;

OCHOA, A ;

DRESSENDORFER, PV ;

KOGA, R ;

KOLASINSKI, WA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :2032-2039

[3] INVESTIGATION OF SOFT UPSETS IN INTEGRATED-CIRCUIT MEMORIES AND CHARGE COLLECTION IN SEMICONDUCTOR TEST STRUCTURES BY THE USE OF AN ION MICROBEAM [J].

KNUDSON, AR ;

CAMPBELL, AB .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :625-631

[4] HEAVY ION-INDUCED SINGLE EVENT UPSETS OF MICROCIRCUITS - A SUMMARY OF THE AEROSPACE CORPORATION TEST DATA [J].

KOGA, R ;

KOLASINSKI, WA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1190-1195

[5] SIMULATION OF COSMIC-RAY INDUCED SOFT ERRORS AND LATCHUP IN INTEGRATED-CIRCUIT COMPUTER MEMORIES [J].

KOLASINSKI, WA ;

BLAKE, JB ;

ANTHONY, JK ;

PRICE, WE ;

SMITH, EC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :5087-5091

[6] SINGLE EVENT UPSET (SEU) OF SEMICONDUCTOR-DEVICES - A SUMMARY OF JPL TEST DATA [J].

NICHOLS, DK ;

PRICE, WE ;

MALONE, CJ .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4520-4525

[7]

SHOGA M, 1986, 4TH ANN DNA DOE NASA

[8]

STAPOR WJ, 1986, IEEE T NUCL SCI, V33

← 1 →