ELECTRON BEAM TECHNIQUE FOR MEASURING MICROVOLT CHANGES IN CONTACT POTENTIAL

被引:22
作者
STEINRIS.F
HETRICK, RE
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D O I
10.1063/1.1685080
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:304 / &
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共 16 条
[1]  
CAMPBELL BD, 1968, SURFACE SCI, V10, P19
[2]   GIANT TEMPERATURE DEPENDENCE OF WORK FUNCTION OF GAP [J].
CHO, AY ;
ARTHUR, JR .
PHYSICAL REVIEW LETTERS, 1969, 22 (22) :1180-&
[3]  
Craig P. P., 1970, Review of Scientific Instruments, V41, P258, DOI 10.1063/1.1684484
[4]  
FRANKL DR, 1967, ELECTRICAL PROPERTIE
[5]  
GUTSCHE E, 1967, 2 6 SEMICONDUCTING C, P337
[6]   THERMIONIC EMISSION [J].
HERRING, C ;
NICHOLS, MH .
REVIEWS OF MODERN PHYSICS, 1949, 21 (02) :185-270
[7]  
Herrmann G., 1951, OXIDE COATED CATHODE, V2
[8]  
KELVIN, 1898, PHILOS MAG, V5, P46
[9]  
Many A., 1965, SEMICONDUCTOR SURFAC
[10]  
ROWE JE, 1970, 10TH P INT C PHYS SE, P217