LOW-TEMPERATURE MOBILITY DUE TO UNSCREENED CHARGED IMPURITIES IN COMPENSATED SEMICONDUCTORS

被引:3
作者
CAPEK, V
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D O I
10.1007/BF01595640
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:684 / 687
页数:4
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