STRUCTURE AND MICROHARDNESS OF TIN COMPOSITIONAL AND ALLOYED FILMS

被引:68
作者
ANDRIEVSKI, RA [1 ]
ANISIMOVA, IA [1 ]
ANISIMOV, VP [1 ]
机构
[1] AS KIRGHIZSTAN,INST PHYS,BISHKEK 720071,USSR
关键词
D O I
10.1016/0040-6090(91)90299-D
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The compositional and alloyed films of TiN containing aluminium, zirconium, chromium and niobium were investigated by X-ray diffraction, electron microscopy and microhardness measurements. The recrystallization of the films was also studied. A general tendency of the microhardness to increase with decrease in layer thickness was found in TiN-ZrN (AlN, CrN, NbN) systems. The decrease in microhardness in these systems with the increase in annealing temperature was also fixed in experiments besides (Ti, Zr)N films in which at T > 800-degrees-C the microhardness was increased. It is assumed that the spinodal decomposition in the TiN-ZrN system is accompanied by an increase in microhardness.
引用
收藏
页码:171 / 175
页数:5
相关论文
共 13 条
[1]  
ANDRIEVSKI RA, 1989, IZV ACAD SCI KIRGHIZ, V2, P32
[2]  
Andrievskii R.A., 1989, STRENGTH REFRACTORY, P368
[3]  
CHINALIEV OK, 1989, P C WEAR RESISTANT F, V1, P65
[4]   PREPARATION AND BEHAVIOR OF WEAR-RESISTANT TIC/TIB2, TIN/TIB2 AND TIC/TIN COATINGS WITH HIGH AMOUNTS OF PHASE BOUNDARIES [J].
HOLLECK, H ;
SCHULZ, H .
SURFACE & COATINGS TECHNOLOGY, 1988, 36 (3-4) :707-714
[5]   METASTABLE COATINGS - PREDICTION OF COMPOSITION AND STRUCTURE [J].
HOLLECK, H .
SURFACE & COATINGS TECHNOLOGY, 1988, 36 (1-2) :151-159
[6]  
HOLLECK H, 1984, BINARE TERNARE CARBI, P319
[7]  
HOLLECK H, 1989, 12TH P INT PLANS SEM, V3, P1
[8]  
irkin L.I., 1961, SPRAVOCHNIK RENTGENO
[9]   ON SPINODAL DECOMPOSITION IN MAGNETRON-SPUTTERED (TI,ZR) NITRIDE AND CARBIDE THIN-FILMS [J].
KNOTEK, O ;
BARIMANI, A .
THIN SOLID FILMS, 1989, 174 :51-56
[10]   DEPOSITION AND CHARACTERIZATION OF TERNARY NITRIDES [J].
RANDHAWA, H ;
JOHNSON, PC ;
CUNNINGHAM, R .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03) :2136-2139