INVESTIGATIONS INTO THE GROWTH OF ALN BY MOCVD USING TERI-TERT-BUTYLALUMINIUM AS AN ALTERNATIVE ALUMINUM SOURCE

被引:16
作者
JONES, AC [1 ]
AULD, J [1 ]
RUSHWORTH, SA [1 ]
HOULTON, DJ [1 ]
CRITCHLOW, GW [1 ]
机构
[1] UNIV LOUGHBOROUGH,INST SURFACE SCI & TECHNOL,LOUGHBOROUGH LE11 3TU,LEICS,ENGLAND
关键词
D O I
10.1039/jm9940401591
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Thin films of AlN have been deposited at 500 and 600-degrees-C by atmospheric-pressure MOCVD using the precursors tri-tert-butylaluminium (But3Al) and tert-butylamine (ButNH2). Growth rates of 0.5 mum h-1 were obtained at 500-degrees-C. Post-growth oxidation of the AlN films was prevented by the deposition of a protective Al overlayer using But3Al.
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收藏
页码:1591 / 1594
页数:4
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