CHARGED PARTICLE ACTIVATION ANALYSIS FOR CARBON, NITROGEN AND OXYGEN IN SEMICONDUCTOR SILCON

被引：36

作者：

NOZAKI, T

YATSURUG.Y

AKIYAMA, N

机构：

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1970年 / 4卷 / 01期

关键词：

D O I：

10.1007/BF02513641

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：87 / &

共 12 条

[1]

ALEKSANDROVA GI, 1967, ATOM ENERG, V23, P106

[2]

CALI JP, 1964, TRACE ANALYSIS SEMIC

[3] EXCITATION FUNCTIONS OF SOME REACTIONS OF 6- TO 24-MEV HE3 IONS WITH CARBON AND ALUMINUM [J].

COCHRAN, DRF ;

KNIGHT, JD .

PHYSICAL REVIEW, 1962, 128 (03) :1281-&

[4]

DEBRUN JL, 1969, 1969 P INT C MOD TRE, P774

[5] ULTRA SENSITIVE ANALYSIS OF LIGHT ELEMENTS IN MATERIALS OF VERY HIGH PURITY BY ACTIVATION USING GAMMA PHOTONS AND CHARGED PARTICLES [J].

ENGELMANN, C .

INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1967, 18 (08) :569-+

[6] STUDY OF (3HE 7BE) REACTION IN 12C [J].

ENGLAND, JBA ;

REECE, BL .

NUCLEAR PHYSICS, 1965, 72 (02) :449-&

[7]

HAHN RL, 1966, PHYS REV, V146, P146

[8] RADIOACTIVATION ANALYSIS OF SEMICONDUCTOR GRAPHITE FOR NITROGEN BY 14N(PI ALPHA)11C REACTION [J].

NOZAKI, T ;

OKUO, T ;

AKUTSU, H ;

FURUKAWA, M .

BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1966, 39 (12) :2685-+

[9] DETERMINATION OF SODIUM IN ULTRAPURE SILICON AND SILICON DIOXIDE FILMS BY ACTIVATION ANALYSIS [J].

OSBORNE, JF ;

LARRABEE, GB ;

HARRAP, V .

ANALYTICAL CHEMISTRY, 1967, 39 (10) :1144-&

[10] STUDIES OF POSSIBILITIES OF DETERMINING OXYGEN IN ZIRCONIUM MOLYBDENUM HAFNIUM AND TUNGSTEN BY IRRADIATION IN HELIUM 3 AND 4 PARTICLES [J].

REVEL, G ;

ALBERT, P .

JOURNAL OF NUCLEAR MATERIALS, 1968, 25 (01) :87-&

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