SECONDARY ION EMISSION FROM BINARY ALLOY SYSTEMS .1. O-2(+) BOMBARDMENT

被引：53

作者：

YU, ML

REUTER, W

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1981年 / 52卷 / 03期

关键词：

D O I：

10.1063/1.329786

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1478 / 1488

页数：11

共 39 条

[1]

ALLEN GC, 1973, J CHEM SOC DALTON, P1675

[2] MULTIPLET SPLITTING OF X-RAY PHOTOELECTRON LINES OF CHROMIUM COMPLEXES - EFFECT OF COVALENCY ON 2P CORE LEVEL SPIN-ORBIT SEPARATION [J].

ALLEN, GC ;

TUCKER, PM .

INORGANICA CHIMICA ACTA, 1976, 16 (JAN) :41-45

[3]

ANDERSEN CA, 1969, INT J MASS SPECTROM, V2, P61

[4] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES [J].

BENNINGHOVEN, A .

SURFACE SCIENCE, 1975, 53 (DEC) :596-625

[5]

Bernheim M., 1973, International Journal of Mass Spectrometry and Ion Physics, V12, P93, DOI 10.1016/0020-7381(73)80090-7

[6] EXPERIMENTAL AND THEORETICAL APPROACHES TO THE IONIZATION PROCESS IN SECONDARY-ION EMISSION [J].

BLAISE, G ;

NOURTIER, A .

SURFACE SCIENCE, 1979, 90 (02) :495-547

[7] OXYGEN INTERACTION WITH NI-FE SURFACES (1) LEED AND XPS STUDIES OF NI 76-PERCENT-FE 24-PERCENT (100) [J].

BRUNDLE, CR ;

SILVERMAN, E ;

MADIX, RJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :474-477

[8] UNIFIED EXPLANATION FOR SECONDARY ION YIELDS [J].

DELINE, VR ;

EVANS, CA ;

WILLIAMS, P .

APPLIED PHYSICS LETTERS, 1978, 33 (07) :578-580

[9] SYSTEM FOR COMBINED SIMS-AES-XPS STUDIES OF SOLIDS [J].

FRISCH, MA ;

REUTER, W ;

WITTMAACK, K .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (06) :695-704

[10] X-RAY PHOTOEMISSION SPECTRA OF PALLADIUM [J].

HUFNER, S ;

WERTHEIM, GK ;

BUCHANAN, DN .

CHEMICAL PHYSICS LETTERS, 1974, 24 (04) :527-530

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