SECONDARY ION EMISSION FROM YBA2CU3O7-X

被引：6

作者：

KOSYACHKOV, AA

机构：

[1] Institute of Metal Physics, Academy of Science of the Ukrainian SSR, 252680 Kiev -142, 36, Vernadskogo

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1992年 / 65卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(92)95102-W

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Secondary ion emission (SIE) from both fused and sputter prepared YBa2Cu3O7-x has been investigated by energy and angular resolved secondary ion mass spectrometry (EARSIMS) under 6 keV Ar+-ion bombardment at an incident angle of 60-degrees. Two states of Ba-atoms were detected with binding energies of 3 eV and 23-29 eV. The angular distributions of SIE were found to display the influence of undeveloped cascades and to be in qualitative agreement with calculated distributions of sputtered atoms.

引用

页码：546 / 549

页数：4

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