MEASUREMENT OF THE DIFFUSION-COEFFICIENT AND RECOMBINATION EFFECTS IN GERMANIUM BY DIFFRACTION FROM OPTICALLY-INDUCED PICOSECOND TRANSIENT GRATINGS

被引：24

作者：

MOSS, SC

LINDLE, JR

MACKEY, HJ

SMIRL, AL

机构：

来源：

APPLIED PHYSICS LETTERS | 1981年 / 39卷 / 03期

关键词：

D O I：

10.1063/1.92688

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：227 / 229

页数：3

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[2] EICHLER HJ, 1978, FESTKORPERPROBLEME, V17, P241
[3] MEASUREMENT OF SURFACE RECOMBINATION VELOCITY IN SEMICONDUCTORS BY DIFFRACTION FROM PICOSECOND TRANSIENT FREE-CARRIER GRATINGS
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[J]. APPLIED PHYSICS LETTERS, 1978, 33 (06) : 536 - 539
[4] UNIFIED APPROACH TO ULTRASONIC LIGHT DIFFRACTION
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