IMPURITY FLUXES IN SCRAPE OFF LAYER OF TFR-400 AND TFR-600

[1] BARNES CW, 1977, COMMUNICATION

[2] SPATIAL-DISTRIBUTION OF LIMITER MATERIAL AND IMPURITIES ON 1ST WALL OF TFR 400 [J]. JOURNAL OF NUCLEAR MATERIALS, 1978, 76-7 (1-2) : 437 - 444

[3] ANALYSIS OF SURFACE-LAYERS BY LIGHT ION BACKSCATTERING AND SPUTTERING COMBINED WITH AUGER-ELECTRON SPECTROSCOPY (AES) [J]. THIN SOLID FILMS, 1973, 19 (01) : 57 - 67

[4] CLAUSING RE, 1976, J NUCL MATER, V63, P495, DOI 10.1016/0022-3115(76)90372-X

[5] LOWER LIMITS FOR PARALLEL IMPURITY FLUXES IN PLT EDGE PLASMA [J]. JOURNAL OF NUCLEAR MATERIALS, 1978, 76-7 (1-2) : 425 - 430

[6] O-H CHARGE-EXCHANGE IN COLD, DENSE HYDROGEN PLASMAS [J]. NUCLEAR FUSION, 1978, 18 (01) : 5 - 8

[7] COHEN SA, 1977, COMMUNICATION

[8] COLCHIN RJ, 1977, 1976 P INT S PLASM W, P95

[9] CONN RW, 1977, B AM PHYS SOC, V22, P1178

[10] USE OF NITROGEN ION BACKSCATTERING FOR ANALYSIS OF METAL IMPURITIES IN A TOKAMAK PLASMA [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 253 - 257

[1] BARNES CW, 1977, COMMUNICATION

[2] SPATIAL-DISTRIBUTION OF LIMITER MATERIAL AND IMPURITIES ON 1ST WALL OF TFR 400 [J]. JOURNAL OF NUCLEAR MATERIALS, 1978, 76-7 (1-2) : 437 - 444

[3] ANALYSIS OF SURFACE-LAYERS BY LIGHT ION BACKSCATTERING AND SPUTTERING COMBINED WITH AUGER-ELECTRON SPECTROSCOPY (AES) [J]. THIN SOLID FILMS, 1973, 19 (01) : 57 - 67

[4] CLAUSING RE, 1976, J NUCL MATER, V63, P495, DOI 10.1016/0022-3115(76)90372-X

[5] LOWER LIMITS FOR PARALLEL IMPURITY FLUXES IN PLT EDGE PLASMA [J]. JOURNAL OF NUCLEAR MATERIALS, 1978, 76-7 (1-2) : 425 - 430

[6] O-H CHARGE-EXCHANGE IN COLD, DENSE HYDROGEN PLASMAS [J]. NUCLEAR FUSION, 1978, 18 (01) : 5 - 8

[7] COHEN SA, 1977, COMMUNICATION

[8] COLCHIN RJ, 1977, 1976 P INT S PLASM W, P95

[9] CONN RW, 1977, B AM PHYS SOC, V22, P1178

[10] USE OF NITROGEN ION BACKSCATTERING FOR ANALYSIS OF METAL IMPURITIES IN A TOKAMAK PLASMA [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 253 - 257