NANOFABRICATION FOR QUANTUM DEVICES

被引:2
作者
KERN, DP
LEE, KY
RISHTON, SA
WIND, SJ
机构
[1] IBM Research, T.J. Watson Research Center, Yorktown, NY
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1992年 / 31卷 / 12B期
关键词
NANOFABRICATION; ELECTRON BEAM LITHOGRAPHY; PATTERN TRANSFER; SELECTIVE EPITAXY; QUANTUM EFFECTS;
D O I
10.1143/JJAP.31.4496
中图分类号
O59 [应用物理学];
学科分类号
摘要
Fabrication of structures for investigation of quantum effects frequently involves the use of MBE/CVD type growth processes to achieve control on an atomic scale in vertical direction and a wide range of combinations of lithography and pattern transfer techniques for control in lateral directions. The challenges ahead lie in the degree of lateral control with which the lithography can be performed, i.e. resolution and placement accuracy, but also in the throughput of the lithography equipment once technological applications are considered. Electron beam resolution can certainly extend to the 1 nm regime, in the case of the STM even to 0.1 nm, appropriate resist materials have to be found, however. Parallelism may be introduced into nanolithography through contact printing with X-rays, electron, ion, or X-ray projection, or arrays of miniaturized scanning electron or ion columns. Pattern transfer relies on a broad spectrum of subtractive and additive processes ranging from wet and dry etching to selective growth techniques. Pattern fidelity and damage to the material are the key issues.
引用
收藏
页码:4496 / 4500
页数:5
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